January 10, 2012

International Workshop on PATSTAT and Patent Statistics 2010.1.19


■ International Workshop on PATSTAT and Patent Statistics

January 19, 2010 at 7F Conference Room, Institute of Intellectual Property, Kanda, Tokyo
Organized by Institute of Intellectual Property
Supported by IIR

Opening Address
Tateo Takiuchi (Institute of Intellectual Property)
Dominique Guellec (OECD Senior Economist)
[1] “Guide to the PATSTAT”
  James Rollinson (European Patent Office)
[2] “Linking of  PATSTAT and IIP Patent Database”
  Kazuyuki Motohashi (University of Tokyo)
[3] “Evaluating Continuing Applications in the US, Using PATSTAT Database”
Naotoshi Tsukada (IIR)
[4] “An Econometric Assessment of the Effects of Patent Thickets“
  Yoichiro Nishimura (Kanagawa University) and Sadao Nagaoka (IIR)

Closing Remarks
Sadao Nagaoka